You are currently viewing only those items made visible to the public. Click here to sign in and view the full catalogue.
Viewing items matching the following properties:
Benchtop Scanning Electron Microscope
more details »
Contact angle measurement equipment for wettability and surface free energy estimations of solid surfaces and surface tension of liquids.
more details »
Horizontally operating quencing and deformation dilatometer.
more details »
The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
more details »
Bench-top turbomolecular-pumped coating system.
more details »
PFIB UXe DualBeam Microscope for Materials Science.
more details »
Bench-top ozone cleaning system used as a pre-electron microscope preparation technique
more details »
The FE-SEM allows for high magnification and resolution imaging.
more details »
Analytical Field Emission Scanning Electron Microscope (FE-SEM).
more details »
High power transmitted/reflected light trinocular inspection microscope, used as a research tool for materials analysis.
more details »
High power transmitted light microscope, used as a research tool for materials analysis.
more details »
LMCC is located within the Materials Department of Loughborough University. The purpose of the centre is to provide a high quality materials characterisation facility to support research within Loughborough University, the wider academic community an
more details »
High precision 5 decimal point laboratory balance (0.01mg up to 81g)
more details »
High power optical trinocular stereo zoom microscope, used as a research tool for materials analysis.
more details »
Bench-top plasma cleaning system.
more details »
Bench-top sputter coating system. With Au/Pd disc target
more details »
High resolution field emission gun scanning electron microscope (FEGSEM)
more details »
Apparatus for automatic, electrolytical thinning of specimens.
more details »
Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
more details »
X-Ray Photoelectron Spectroscopy (XPS). Used in the element identification of samples and can also provide information about an element's chemical environment.
more details »
Bench-top X-ray diffractometer.
more details »
Fully integrated, monochromated X-ray Photoelectron Spectrometer (XPS) system.
more details »