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LFA 447 Nanoflash

MANUFACTURER Netzsch (manufacturer's website)
MODEL LFA 447
ACRONYM LFA447
AVAILABILITY On request
RESTRICTIONS Specialist training is required for sample preparation and data analysis
TRAINING Although training is required to use this item, we cannot arrange it for you.
CALIBRATED Yes, this item is calibrated.
Last Calibration: 15th January, 2018
Next Calibration: 16th April, 2018
CUSTODIAN Giuseppe Forte
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SITE Holywell Park

Description

The NETZSCH LFA 447 NanoFlash® is based on the well-known flash method. In this method, the front side of a plane-parallel sample is heated by a short light pulse. The resulting temperature rise on the rear surface is measured using an infrared detector. By analysis of the resulting temperature-versus-time curve, the thermal diffusivity can be determined. The LFA 447 NanoFlash® is a powerful research tool for making accurate, rapid thermal diffusivity tests on small specimens. It can complete tests on dozens of samples at room temperature in a single morning or make measurements at temperatures up to 300°C automatically.

Specification

Oven temperature range +10 °C to +300 °C. Sample Size 6, 8, 10, 12.7 or 25.4mm, round or square. Thickness depending on Heat diffusivity. In-Plane and Through-Plane fixtures available. Fixtures for liquids and solids are available.

Upgrades

In Plane Sample Holder; Low Viscosity Sample Holder; Laminated sample holder.

Future Upgrades

MTX-Version - A special version with a matrix system (MTX) allows scanning of surfaces (50 mm x 50 mm) for analysis of the thermal diffusivity over the area. This enables the detection of structural inhomogeneities or defects under the surface. Pressure sample Holder; Sample holder for liquid metals and highly conductive powders.

Item ID #2455.

Last Updated: 6th March, 2018

LFA 447 Nanoflash