You are currently viewing only those items made visible to the public. Click here to sign in and view the full catalogue.
|Enquire about this item|
The TEM uses thin samples to examine internal microstructure at a resolution down to the sub-nanometre level. A combination of imaging, electron diffraction and EDX analysis allows detailed characterisation to be carried out. With addition of Gatan Erlangshen ES500W digital camera.
Item ID #.
Last Updated: 7th December, 2012