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Transmission Electron Microscope

MANUFACTURER JEOL
MODEL 2000FX
ACRONYM TEM
CUSTODIAN Zhaoxia Zhou
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SITE West Park

Description

The TEM uses thin samples to examine internal microstructure at a resolution down to the sub-nanometre level. A combination of imaging, electron diffraction and EDX analysis allows detailed characterisation to be carried out. With addition of Gatan Erlangshen ES500W digital camera.

Item ID #248.

Last Updated: 7th December, 2012

Transmission Electron Microscope