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MANUFACTURER | Shimadzu (manufacturer's website) |
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MODEL | ICPE-9000 |
ACRONYM | ICPE |
AVAILABILITY | Upon Request |
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TRAINING | Training is required to use this item and we can arrange this if needed. |
CUSTODIAN | Mrs Jayshree Bhuptani |
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ADDITIONAL CONTACT | Geoff Russell |
Enquire about this item | |
SITE | West Park |
Shimadzu´s new simultaneous ICPE-9000 can be used in application stages for a wide range of high-precision analytical assessments from high-level R&D to environmental management analysis to high-concentration component analysis. The ICPE-9000 utilizes a large-scale CCD detector, an Echelle spectrometer, as well as an extremely stable vacuum spectrometer, which enables stable performance over extended periods. The ICPE-9000´s innovative Mini Torch minimizes cost by reducing consumption of argon gas to half that of conventional torches.
The ICPE-9000 features easy-to-use, innovative ICPEsolution Software, which offers such features as a Method Development Assistant, a Diagnosis Assistant, and more.
Utilizing a large-scale 1-inch, 1 megapixel CCD detector, together with an Echelle spectrometer, provides high-speed measurement while retaining precise resolution.
The ICPE-9000 maintains stable performance - even during long-term analyses - with almost no reduction in sensitivity by utilizing these key components:
Light source | Torch Sample nebulizing chamber Plasma torch Nebulizer | Axial observation (Axial/radial switching is optional) Cyclone chamber Mini torch (conventional torch can also be used) Coaxial type |
Radio frequency generator | Oscillator Max. output Output stability Circuit element Ignition method Load matching | Quartz oscillator 1.6 kW ± 0.3% max. All solid state Fully automatic Automatic |
Spectrometer | Optical system Wavelength range Detector Resolution Measurement in vacuum UV range Spectrometer temperature control | Echelle spectrometer 167 - 800 nm Semiconductor surface detector (CCD) ≤ 0.005nm @ 200nm Vacuum spectrometer Yes |
Software | Automatic wavelength selection Automatic creation of interfering element information Qualitative analysis Quantitative analysis | Semi-quantitative output Stores data for all wavelength range |
Analysis performance | 30 seconds (integration) | Full element measurement |
Size | 1350 (W) x 760 (D) x 740 (H) mm | |
Weight | 270 kg | |
Operating environment | Temperature Humidity Power source Other | 18 - 28 °C 20 - 70% 200 V AC ±10%, 30 A, 50/60 Hz For details please refer to installation requirement manual. |
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.Last Updated: 26th June, 2012