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Viewing items matching the following properties:

Organisational Unit : Materials [x]
Category : Electron Microscopy [x]

Benchtop Scanning Electron Microscope

Benchtop Scanning Electron Microscope
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- Manufacturer: Hitachi
- Technique: Electron Microscopy
DualBeam (FIB-SEM) Microscope System

The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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- Manufacturer: FEI
- Technique: Scanning electron microscopy
Helios G4 PFIB UXe DualBeam Microscope

PFIB UXe DualBeam Microscope for Materials Science.
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- Manufacturer: FEI
- Technique: Microscopy
JSM-7100F Field Emission Scanning Electron Microscope

The FE-SEM allows for high magnification and resolution imaging.
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- Manufacturer: JEOL
- Technique: Scanning Electron Microscopy
JSM-7800F Field Emission Scanning Electron Microscope

Analytical Field Emission Scanning Electron Microscope (FE-SEM).
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- Manufacturer: JEOL
- Technique: Scanning Electron Microscopy
Scanning Electron Microscope

High resolution field emission gun scanning electron microscope (FEGSEM)
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- Manufacturer: Carl Zeiss (Leo)
- Technique: Scanning electron microscope
Transmission Electron Microscope

Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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- Manufacturer: FEI
- Technique: Transmission Electron Microscopy