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FCS Simulator Systems

Driving Simulator

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- Manufacturer: FCS Simulator Systems
- Organisational Unit: Aeronautical and Automotive Engineering

FEI

Helios G4 PFIB UXe DualBeam Microscope

PFIB UXe DualBeam Microscope for Materials Science.
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- Manufacturer: FEI
- Technique: Microscopy
- Organisational Unit: Materials
DualBeam (FIB-SEM) Microscope System

The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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- Manufacturer: FEI
- Technique: Scanning electron microscopy
- Organisational Unit: Materials
Transmission Electron Microscope

Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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- Manufacturer: FEI
- Technique: Transmission Electron Microscopy
- Organisational Unit: Materials

Fischione

Plasma Cleaner

Bench-top plasma cleaning system.
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- Manufacturer: Fischione
- Technique: Plasma Cleaning
- Organisational Unit: Materials

Froude Hofmann

Eddy Current Dynamometer

Eddy current dynamometer specifically designed for engine testing
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- Manufacturer: Froude Hofmann
- Technique: Engine Testing
- Organisational Unit: Aeronautical and Automotive Engineering