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Equipment and facilities are available for manufacturers starting with the following letters.
ICP-MS elemental analysis machine.
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Fully integrated, monochromated X-ray Photoelectron Spectrometer (XPS) system.
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The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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6 needle industrial embroidery machine for placement / motif embroidery . wilcom software
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Mechanical Total Station featuring on-board Trimble Accessâ„¢ field Software.
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Trimble R6 GPS Receiver - A Base Station and Rover Receiver for RTK GPS / GNSS Surveying
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