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|MANUFACTURER||JEOL (manufacturer's website)|
|MODEL||JSM - 7100F|
|AVAILABILITY||Contact for Details|
|TRAINING||Training is required to use this item and we can arrange this if needed.|
|CALIBRATED||Yes, this item is calibrated.|
|ADDITIONAL CONTACT||Scott Doak|
|Enquire about this item|
The FE-SEM consists of a high resolution field emission electron column. This allows for high magnification and resolution imaging using electrons.
Resolution of secondary electron image (SEI):
Probe current: 1xl0–12 to 2xl0–7 A
Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution. Collect large area EBSD maps at low magnifications without distortion Perform low kV imaging and analysis of highly magnetic samples. Large area EDS (EDX) is available for chemical composition analysis. Low Vacuum operation capability.
Item ID #.
Last Updated: 11th August, 2016