Electron Microscopy

The following equipment and facilities are listed under this category.

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  Benchtop Scanning Electron Microscope

  Benchtop Scanning Electron Microscope
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  • Manufacturer: Hitachi
  • Technique: Electron Microscopy
  • Organisational Unit: Materials
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  DualBeam (FIB-SEM) Microscope System

  The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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  • Manufacturer: FEI
  • Technique: Scanning electron microscopy
  • Organisational Unit: Materials
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  Helios G4 PFIB UXe DualBeam Microscope

  PFIB UXe DualBeam Microscope for Materials Science.
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  • Manufacturer: FEI
  • Technique: Microscopy
  • Organisational Unit: Materials
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  JSM-7100F Field Emission Scanning Electron Microscope

  The FE-SEM allows for high magnification and resolution imaging.
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  • Manufacturer: JEOL
  • Technique: Scanning Electron Microscopy
  • Organisational Unit: Materials
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  JSM-7800F Field Emission Scanning Electron Microscope

  Analytical Field Emission Scanning Electron Microscope (FE-SEM).
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  • Manufacturer: JEOL
  • Technique: Scanning Electron Microscopy
  • Organisational Unit: Materials
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  Scanning Electron Microscope

  High resolution field emission gun scanning electron microscope (FEGSEM)
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  • Manufacturer: Carl Zeiss (Leo)
  • Technique: Scanning electron microscope
  • Organisational Unit: Materials
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  Transmission Electron Microscope

  Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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  • Manufacturer: FEI
  • Technique: Transmission Electron Microscopy
  • Organisational Unit: Materials