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DualBeam (FIB-SEM) Microscope System
| MANUFACTURER | Thermofisher (FEI) (manufacturer's website) |
|---|---|
| MODEL | Scios 2 |
| ACRONYM | FIB |
| TRAINING | Training is required to use this item and we can arrange this if needed. |
|---|
| CUSTODIAN | Sam Davis |
|---|---|
| ADDITIONAL CONTACT | Stuart Robertson |
| Enquire about this item | |
| SITE | West Park |
Description
The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument. This allows milling of cross sections (typically 20 x 5 microns) through samples and subsequent imaging using either electrons or ions.
Typical applications
Ancillary equipment
- Oxford Instruments X-Max infinity, Energy-dispersive X-ray microanalysis (EDS) System.
- Oxford Instruments Symmetry 2, Electron Backscatter Diffraction (EBSD) system.
- High speed electrostatic beam blanker.
- Easylift micromanipulator.
- 2 Gas Injectors (Tungsten and Insulator enhance etch (IEE)).
- Retractable backscatter detector with low voltage capability.
Specification
Resolution @ optimum WD 1.4 nm @ 1 kV 1.2 nm @ 1 kV (Beam deceleration*)
Detectors available
- T1 segmented lower in-lens
- T2 upper in-lens detector
- T3 in-column detector
Item ID #.
Last Updated: 6th November, 2026
