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Contact angle measurement equipment for wettability and surface free energy estimations of solid surfaces and surface tension of liquids.more details »
Used in elemental composition and depth profiling of samples with the combination of AES analysis and inert ion bombardment. Typically used for the analysis of metals, semiconductors, glasses and ceramics.more details »
Measurements of Thermal diffusivity, specific heat, and thermal conductivity conform to ASTM E1461-07, “Standard Test Method for Thermal Diffusivity by the Flash Method”more details »
X-Ray Photoelectron Spectroscopy (XPS). Used in the element identification of samples and can also provide information about an element's chemical environment.more details »
Fully integrated, monochromated X-ray Photoelectron Spectrometer (XPS) system.more details »
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