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JSM-7100F Field Emission Scanning Electron Microscope

MANUFACTURER JEOL (manufacturer's website)
MODEL JSM - 7100F
ACRONYM FE-SEM
AVAILABILITY Contact for Details
TRAINING Training is required to use this item and we can arrange this if needed.
CALIBRATED Yes, this item is calibrated.
CUSTODIAN Keith Yendall
ADDITIONAL CONTACT Scott Doak
Enquire about this item
SITE West Park

Description

The FE-SEM consists of a high resolution field emission electron column. This allows for high magnification and resolution imaging using electrons.

Different Capabilities

  • Low Vacuum Mode
  • Large Depth Field
  • UED
  • LED
  • USD

Specification

Performance

Resolution of secondary electron image (SEI):

  • 1.2 nm guaranteed at 30 kV
  • 3.0 nm guaranteed at 1 kV

Probe current: 1xl0–12 to 2xl0–7 A


Typical Applications

Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution. Collect large area EBSD maps at low magnifications without distortion Perform low kV imaging and analysis of highly magnetic samples. Large area EDS (EDX) is available for chemical composition analysis. Low Vacuum operation capability.

Upgrades

Edax EBS, Edax EBSD, Retractable Back scatter detector, Plasma Cleaner.

Future Upgrades

Item ID #2452.

Last Updated: 11th August, 2016

JSM-7100F Field Emission Scanning Electron Microscope