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JSM-7100F Field Emission Scanning Electron Microscope
| MANUFACTURER | JEOL (manufacturer's website) |
|---|---|
| MODEL | JSM - 7100F |
| ACRONYM | FE-SEM |
| AVAILABILITY | Contact for Details |
|---|---|
| TRAINING | Training is required to use this item and we can arrange this if needed. |
| CALIBRATED | Yes, this item is calibrated. |
| CUSTODIAN | Keith Yendall |
|---|---|
| ADDITIONAL CONTACT | Sam Davis |
| Enquire about this item | |
| SITE | West Park |
Description
The FE-SEM consists of a high resolution field emission electron column. This allows for high magnification and resolution imaging using electrons.
Different Capabilities
- Low Vacuum Mode
- Large Depth Field
- UED
- LED
- USD
Specification
Performance
Resolution of secondary electron image (SEI):
- 1.2 nm guaranteed at 30 kV
- 3.0 nm guaranteed at 1 kV
Probe current: 1xl0–12 to 2xl0–7 A
Typical Applications
Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution. Collect large area EBSD maps at low magnifications without distortion Perform low kV imaging and analysis of highly magnetic samples. Large area EDS (EDX) is available for chemical composition analysis. Low Vacuum operation capability.
Upgrades
* Oxford Instruments X-max 80, Energy-dispersive X-ray spectroscopy (EDS).
* Oxford Instruments Nordlys, Electron Backscatter Diffraction (EBSD).
Retractable Back scatter detector,
Plasma Cleaner.
Future Upgrades
Item ID #.
Last Updated: 18th June, 2024
