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Bench-top ESI-TOF instrument.
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Emission spectrometer used in the application stages for a wide range of high-precision analytical assessments from high-level R&D to environmental management analysis to high-concentration component analysis.
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The FE-SEM allows for high magnification and resolution imaging.
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Analytical Field Emission Scanning Electron Microscope (FE-SEM).
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Bench-top ion trap GC-MS system.
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ICP-MS elemental analysis machine.
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Quadrupole time-of-flight ion mobility spectrometer.
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