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Anechoic chamber with full vehicle access, used for acoustics and vibration measurements with optional noise flow generator. No gas extraction facilities.
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Benchtop Scanning Electron Microscope
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Floor standing 3 axis CNC Milling Machine.
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Contact angle measurement equipment for wettability and surface free energy estimations of solid surfaces and surface tension of liquids.
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Horizontally operating quencing and deformation dilatometer.
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High performance PIV/PTV camera w/60mm Nikon lens
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The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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a bespoke facility for engine testing.
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Eddy current dynamometer specifically designed for engine testing
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Four-poster hydraulic rig for vehicle dynamics and control analysis
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Bench-top turbomolecular-pumped coating system.
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Automatic micro/macro hardness tester/mapper with extended load range for Vickers and Knoop
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PFIB UXe DualBeam Microscope for Materials Science.
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Bench-top ozone cleaning system used as a pre-electron microscope preparation technique
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The FE-SEM allows for high magnification and resolution imaging.
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Analytical Field Emission Scanning Electron Microscope (FE-SEM).
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High power transmitted/reflected light trinocular inspection microscope, used as a research tool for materials analysis.
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High power transmitted light microscope, used as a research tool for materials analysis.
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LMCC is located within the Materials Department of Loughborough University. The purpose of the centre is to provide high quality materials characterisation to support research within the University, wider academic community, and industry.
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High precision 5 decimal point laboratory balance (0.01mg up to 81g)
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High power optical trinocular stereo zoom microscope, used as a research tool for materials analysis.
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Bench-top plasma cleaning system.
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Bench-top sputter coating system. With Au/Pd disc target
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High resolution field emission gun scanning electron microscope (FEGSEM)
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Apparatus for automatic, electrolytical thinning of specimens.
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Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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X-Ray Photoelectron Spectroscopy (XPS). Used in the element identification of samples and can also provide information about an element's chemical environment.
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AAE Large Wind Tunnel
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Bench-top X-ray diffractometer.
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Fully integrated, monochromated X-ray Photoelectron Spectrometer (XPS) system.
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