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Helios G4 PFIB UXe DualBeam Microscope

MANUFACTURER FEI
MODEL Helios G4
ACRONYM PFIB
TRAINING Training is required to use this item and we can arrange this if needed.
CUSTODIAN Scott Doak
ADDITIONAL CONTACT Sabrina Yan
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SITE West Park

Description

Helios G4 PFIB delivers unmatched capabilities for large volume 3D characterization, Ga+free sample preparation and precise micromachining. Helios G4 PFIB UXe is part of the fourth generation of the industry leading Helios DualBeam family. It combines the new PFIB 2.0 column and the Monochromated Elstarâ„¢ SEM column to deliver the most advanced focused ion- and electron beam performance. Intuitive software and an unprecedented level of automation and ease-of-use provide observation and analysis of relevant subsurface volumes by scientists and engineers.

Item ID #2460.

Last Updated: 4th December, 2018

Helios G4 PFIB UXe DualBeam Microscope