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Transmission Electron Microscope

MANUFACTURER FEI (manufacturer's website)
TRAINING Training is required to use this item and we can arrange this if needed.
CUSTODIAN Zhoaxia Zhou
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SITE West Park


The FEI Tecnai™ F20 is a versatile Transmission Electron Microscope (TEM) that can operate in conventional parallel illumination mode or as a Scanning Transmission Electron Microscope (STEM). In STEM mode the system is able to provide high spatial resolution chemical information from either the revolutionary new large area (80mm^2) windowless Silicon Drift Detector (SDD) or the complementary spectrum mapping using the Gatan ENFINA Electron Energy Loss Spectrometer.

The system is one of the second generation (G2) series of microscopes that use a thermally assisted field emission gun. The Supertwin (S-TWIN) symmetric lenses are optimized for versatility combining high resolution in both TEM and STEM, whilst providing sufficient space for high angular sample manipulation and high count rate capability in X-Ray microanalysis. In addition to the EDS and PEELS spectometers, the system is also equipped with a Gatan mulitscan CCD camera, a Fischione High Angular Dark Field detector (HAADF) and separate bright field and dark field detectors.

Typical applications

  • Materials sciences
  • Nanotechnology
  • Semiconductor
  • Life sciences.


  • Accelerating Voltage: 200 kV
  • Electron Source: Schottky Field Emission Gun
  • Objective Lens: FEI Supertwin (S-TWIN)
  • Cs = 1.2 mm
  • Point resolution = 0.24 nm
  • Line resolution = 0.15nm
  • Allowable goniometer tilt about 40° / 30° (double tilt)
  • Compustage control of the specimen position and tilt
  • 3-fold stigmators
  • Gatan Multiscan CCD Camera
  • STEM capability with a spatial resolution 0.2nm (theoretical)
  • Gatan Bright and Dark field STEM detectors
  • Fischione HAADF STEM detector
  • Gatan Enfina Electron Energy Loss Spectrometer
  • STEM Spectrum imaging
  • Oxford Instruments X-Max 80mm^2 windowless energy-dispersive spectrometer (EDS)

Item ID #2314.

Last Updated: 13th May, 2020

Transmission Electron Microscope