Enquire Now

Scanning Electron Microscope

MANUFACTURER Carl Zeiss (Leo) (manufacturer's website)
MODEL 1530 VP
ACRONYM FEGSEM
AVAILABILITY Upon Request
TRAINING Training is required to use this item and we can arrange this if needed.
CALIBRATED Yes, this item is calibrated.
CUSTODIAN Keith Yendall
ADDITIONAL CONTACT Scott Doak
Enquire about this item
SITE West Park

Description

High resolution field emission gun scanning electron microscope (FEGSEM), which provides the ability to visualize surface features of material down to 1 nanometre resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and an electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces. Furthermore, a variable pressure sample chamber enables non-conducting specimens to be observed without coating.

Instrument Features

  • Energy dispersive X-ray spectroscopy (EDS) using Oxford Instruments X-Max 80mm2 Detector
  • Electron backscattering diffraction detector (EBSD) with HKLNordlys F high speed Camera
  • Fore-scatter detectors (FSD)
  • Back-scattered detector (QBSD)
  • Inlens annular detector
  • Variable Pressure Mode
  • Oxford Instruments Aztec EDS/EBSD microanalysis software with TrueMap capability.

Item ID #245.

Last Updated: 21st June, 2013

Scanning Electron Microscope