Scanning Electron Microscope

High resolution field emission gun scanning electron microscope (FEGSEM), which provides the ability to visualize surface features of material down to 1 nanometre resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and an electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces. Furthermore, a variable pressure sample chamber enables non-conducting specimens to be observed without coating.

Instrument Features

• Energy dispersive X-ray spectroscopy (EDS) using Oxford Instruments X-Max 80mm² Detector
• Electron backscattering diffraction detector (EBSD) with HKLNordlys F high speed Camera
• Fore-scatter detectors (FSD)
• Back-scattered detector (QBSD)
• Inlens annular detector
• Variable Pressure Mode
• Oxford Instruments Aztec EDS/EBSD microanalysis software with TrueMap capability.