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DualBeam (FIB-SEM) Microscope System
| MANUFACTURER | FEI (manufacturer's website) |
|---|---|
| MODEL | Nova 600 Nanolab Dual Beam |
| ACRONYM | FIB |
| TRAINING | Training is required to use this item and we can arrange this if needed. |
|---|
| CUSTODIAN | Sam Davis |
|---|---|
| ADDITIONAL CONTACT | Stuart Robertson |
| Enquire about this item | |
| SITE | West Park |
Description
The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument. This allows milling of cross sections (typically 20 x 5 microns) through samples and subsequent imaging using either electrons or ions.
Typical applications
Ancillary equipment
- Oxford Instruments X-Max 80, Energy-dispersive X-ray microanalysis (EDS) System.
- High speed electrostatic beam blanker.
- OMNIPROBE micromanipulator.
- 2 Gas Injectors (Platinum and Insulator enhance etch (IEE)).
- Solid state retractable backscatter detector with low voltage capability.
Specification
Resolution @ optimum WD 1.1 nm @ 15 kV (TLD-SE) 2.5 nm @ 1 kV (TLD-SE) 3.5 nm @ 500V TLD-SE 5.5 nm @ 500 V TLD-BSE
Item ID #.
Last Updated: 18th June, 2024
