AVAILABILITY |
Office hours |
TRAINING |
Training is required to use this item and we can arrange this if needed. |
Description
Benchtop Scanning Electron Microscope (SEM).
Specification
- Magnification: 15x - 30.000x (digital zoom x2 or x4)
- Resolution: 30nm
- Maximum sample size: 70mm in diameter
- Maximum sample height: 50mm
- Signal detection: High-Sensitivity semiconductor 4-segment BSE detector
Upgrades
Fitted with an Oxford Instruments Swift ED3000 Silicon drift detector (SDD) allowing Energy Dispersive X-ray Spectrometry (EDS). Light element detection from Boron upwards with standardless quantitative analysis. Linescan, Mapping and multiple Point Analysis available.
Deben Sprite XY stage automation provides joystick control using a high resolution stepper motor control with 10nm step size and a repositioning accuracy to 1μm. 99 position memory store for recalling points of interest.
Future Upgrades
Item ID #2441.
Last Updated: 11th September, 2023