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Benchtop Scanning Electron Microscope

MANUFACTURER Hitachi (manufacturer's website)
MODEL TM3030
ACRONYM SEM
AVAILABILITY Office hours
TRAINING Training is required to use this item and we can arrange this if needed.
CUSTODIAN Scott Doak
ADDITIONAL CONTACT Shaun Fowler
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SITE West Park

Description

Benchtop Scanning Electron Microscope (SEM).

Specification

  • Magnification: 15x - 30.000x (digital zoom x2 or x4)
  • Resolution: 30nm
  • Maximum sample size: 70mm in diameter
  • Maximum sample height: 50mm
  • Signal detection: High-Sensitivity semiconductor 4-segment BSE detector

Upgrades

Fitted with an Oxford Instruments Swift ED3000 Silicon drift detector (SDD) allowing Energy Dispersive X-ray Spectrometry (EDS). Light element detection from Boron upwards with standardless quantitative analysis. Linescan, Mapping and multiple Point Analysis available. Deben Sprite XY stage automation provides joystick control using a high resolution stepper motor control with 10nm step size and a repositioning accuracy to 1μm. 99 position memory store for recalling points of interest.

Future Upgrades

Item ID #2441.

Last Updated: 13th May, 2020

Benchtop Scanning Electron Microscope