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Benchtop Scanning Electron Microscope
| MANUFACTURER | Hitachi (manufacturer's website) |
|---|---|
| MODEL | TM3030 |
| ACRONYM | SEM |
| AVAILABILITY | Office hours |
|---|---|
| TRAINING | Training is required to use this item and we can arrange this if needed. |
| CUSTODIAN | Shaun Fowler |
|---|---|
| Enquire about this item | |
| SITE | West Park |
Description
Benchtop Scanning Electron Microscope (SEM).
Specification
- Magnification: 15x - 30.000x (digital zoom x2 or x4)
- Resolution: 30nm
- Maximum sample size: 70mm in diameter
- Maximum sample height: 50mm
- Signal detection: High-Sensitivity semiconductor 4-segment BSE detector
Upgrades
Fitted with an Oxford Instruments Swift ED3000 Silicon drift detector (SDD) allowing Energy Dispersive X-ray Spectrometry (EDS). Light element detection from Boron upwards with standardless quantitative analysis. Linescan, Mapping and multiple Point Analysis available.
Deben Sprite XY stage automation provides joystick control using a high resolution stepper motor control with 10nm step size and a repositioning accuracy to 1μm. 99 position memory store for recalling points of interest.
Future Upgrades
Item ID #.
Last Updated: 11th September, 2023
