You are currently viewing only those items made visible to the public. Click here to sign in and view the full catalogue.
Deprecated: Creation of dynamic property ItemRenderer::$_wikiparser is deprecated in /data/sites/equipment/webroot/app/classes/itemrenderer.php on line 20
JSM-7800F Field Emission Scanning Electron Microscope
| MANUFACTURER | JEOL (manufacturer's website) |
|---|---|
| MODEL | JSM - 7800F |
| ACRONYM | FE-SEM |
| AVAILABILITY | Contact for Details |
|---|---|
| TRAINING | Training is required to use this item and we can arrange this if needed. |
| CALIBRATED | Yes, this item is calibrated. |
| CUSTODIAN | Keith yendall |
|---|---|
| ADDITIONAL CONTACT | Sam Davis |
| Enquire about this item | |
| SITE | West Park |
Description
Analytical field emission scanning electron microscope (FE-SEM), that enables high resolution observation of the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces and large area EBSD maps at low magnifications without distortion.
Column Modes
- SEM
- Large Depth Focus (LDF)
- Gentle Beam (GB)
System detectors
- Lower Electron Detector (LED)
- Upper Electron Detector (UED)
- Upper Secondary Electron Detector (USD)
- Retractable Electron Backscatter Detector (RBEI)
Specification
Performance
Secondary Electron Image Resolution
- 1.0nm at 15kV
- 0.8nm at 15kV, GB mode
- 1.5nm at 1.0kV
- 1.2nm at 1.0 kV, GB mode
- 3.0nm at 100V, GB mode
- 3.0nm, 15kV, 5nA, EDS WD of 10mm
Typical Applications
- Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution.
- Collect large area EBSD maps at low magnifications without distortion.
- Perform low kV imaging and analysis of highly magnetic samples.
- Image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector.
- Large area EDS (EDX) is available for chemical composition analysis.
Upgrades
* Oxford Instruments Ulti-max, Energy-dispersive X-ray spectroscopy (EDS).
* Oxford Instruments Symmetry S2, Electron Backscatter Diffraction (EBSD).
* Retractable Back scatter detector,
* Plasma Cleaner.
Future Upgrades
Item ID #.
Last Updated: 18th June, 2024
