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|MANUFACTURER||JEOL (manufacturer's website)|
|MODEL||JSM - 7800F|
|AVAILABILITY||Contact for Details|
|TRAINING||Training is required to use this item and we can arrange this if needed.|
|CALIBRATED||Yes, this item is calibrated.|
|ADDITIONAL CONTACT||Scott Doak|
|Enquire about this item|
Analytical field emission scanning electron microscope (FE-SEM), that enables high resolution observation of the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces and large area EBSD maps at low magnifications without distortion.
Secondary Electron Image Resolution
Item ID #.
Last Updated: 11th August, 2016