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JSM-7800F Field Emission Scanning Electron Microscope

MANUFACTURER JEOL (manufacturer's website)
MODEL JSM - 7800F
ACRONYM FE-SEM
AVAILABILITY Contact for Details
TRAINING Training is required to use this item and we can arrange this if needed.
CALIBRATED Yes, this item is calibrated.
CUSTODIAN Keith yendall
ADDITIONAL CONTACT Scott Doak
Enquire about this item
SITE West Park

Description

Analytical field emission scanning electron microscope (FE-SEM), that enables high resolution observation of the finest structural morphology of nano-materials at 1,000,000X magnification with sub-1nm resolution. The instrument also includes an energy dispersive X-ray spectroscopy system (EDS/EDX) for chemical analysis and electron backscattering diffraction system (EBSD) which allows for high speed collection of crystallographic data from sample surfaces and large area EBSD maps at low magnifications without distortion.

Column Modes

  • SEM
  • Large Depth Focus (LDF)
  • Gentle Beam (GB)

System detectors

  • Lower Electron Detector (LED)
  • Upper Electron Detector (UED)
  • Upper Secondary Electron Detector (USD)
  • Retractable Electron Backscatter Detector (RBEI)

Specification

Performance

Secondary Electron Image Resolution

  • 1.0nm at 15kV
  • 0.8nm at 15kV, GB mode
  • 1.5nm at 1.0kV
  • 1.2nm at 1.0 kV, GB mode
  • 3.0nm at 100V, GB mode
  • 3.0nm, 15kV, 5nA, EDS WD of 10mm

Typical Applications

  • Observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution.
  • Collect large area EBSD maps at low magnifications without distortion.
  • Perform low kV imaging and analysis of highly magnetic samples.
  • Image thin, electron transparent samples with sub 0.8 nm resolution using an optional retractable STEM detector.
  • Large area EDS (EDX) is available for chemical composition analysis.

Upgrades

Oxford Instruments X-Max 80 EDS, Oxford Instruments EBSD, Insitu Plasma Cleaner.

Future Upgrades

Item ID #2451.

Last Updated: 11th August, 2016

JSM-7800F Field Emission Scanning Electron Microscope