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| CUSTODIAN | Keith Yendall |
|---|---|
| ADDITIONAL CONTACT | Stuart Robertson |
| Enquire about this item | |
| SITE | West Park |
Description
LMCC is located within the Materials Department of Loughborough University. The purpose of the centre is to provide a high quality materials characterisation facility to support research within Loughborough University, the wider academic community and for industrial clients.
It has a wide range of analytical techniques, some of which have capabilities unique within the UK. The main areas of expertise are Electron and Optical Microscopy, Surface Analysis, X-Ray Diffraction and Thermal Analysis. The facilities are supported by a team of specialists who enable researchers to gain the maximum benefits from the instrumentation.
The LMCC not only makes use of sophisticated analytical techniques but continues to develop new methods and capabilities. It has worked with leading instrument manufacturers to help them improve their products and shift the boundaries in materials analysis.
Associated Items
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Benchtop Scanning Electron Microscope
Benchtop Scanning Electron Microscope
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Collodal Dynamics Acoustosizer II
Bench-top particle size distribution analyzer.
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Contact angle measurement equipment
Contact angle measurement equipment for wettability and surface free energy estimations of solid surfaces and surface tension of liquids.
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Dilatometer
Horizontally operating quencing and deformation dilatometer.
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DualBeam (FIB-SEM) Microscope System
The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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Gold Sputter Coater/ Carbon Evaporator
Bench-top turbomolecular-pumped coating system.
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Hardness tester
Automatic micro/macro hardness tester/mapper with extended load range for Vickers and Knoop
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Helios G4 PFIB UXe DualBeam Microscope
PFIB UXe DualBeam Microscope for Materials Science.
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Hitachi Zone SEM
Bench-top ozone cleaning system used as a pre-electron microscope preparation technique
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Inverted Microscope
Advanced inverted metallurgy microscope utilising multiple imaging techniques including computerised XYZ stage control with multi feature software suite for in situ imaging and post process imaging.
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Ion Milling System
Computer controlled ion milling system.
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JEOL JAMP-7100
Used in elemental composition and depth profiling of samples with the combination of AES analysis and inert ion bombardment. Typically used for the analysis of metals, semiconductors, glasses and ceramics.
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JSM-7100F Field Emission Scanning Electron Microscope
The FE-SEM allows for high magnification and resolution imaging.
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JSM-7800F Field Emission Scanning Electron Microscope
Analytical Field Emission Scanning Electron Microscope (FE-SEM).
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Leica DMLM Reflectance/Transmission Optical Microscope
High power transmitted/reflected light trinocular inspection microscope, used as a research tool for materials analysis.
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Leical DMRX Transmission Optical Microscope
High power transmitted light microscope, used as a research tool for materials analysis.
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Malvern Instruments Mastersizer 2000
Bench-top particle size analyser.
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Mass Spectroscopy
Laser ionization mass analyzer (LIMA) or Laser Microprobe Mass Spectrometry (LMMS/LAMMS), for qualitative elemental and molecular fragment analysis.
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Nikon SMZ1500 Optical Stereo Microscope
High power optical trinocular stereo zoom microscope, used as a research tool for materials analysis.
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Plasma Cleaner
Bench-top plasma cleaning system.
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Polaron Emitech SC7640 Sputter Coater
Bench-top sputter coating system. With Au/Pd disc target
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Scanning Electron Microscope
High resolution field emission gun scanning electron microscope (FEGSEM)
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Setaram Setsys Evolution Evolution - TGA/DSC
Combined Thermogravimetric Analyser & Differential Scanning Calorimeter
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Setaram Setsys Evolution TMA
High-performance modular ThermoMechanical Analyzer
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Shimadzu IRTracer-100
Bench-top FT-IR spectrometer
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TA Instruments 2940 TMA
Modulated TMA.
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TA Instruments Q5000IR
Bench-top TGA.
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TA Instruments SDT 2960 Simultaneous TGA/DSC
Simultaneous Thermal Analysis (STA).
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Transmission Electron Microscope
The TEM uses thin samples to examine internal microstructure at a resolution down to the sub-nanometre level. A combination of imaging, electron diffraction and EDX analysis allows detailed characterisation to be carried out.
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Transmission Electron Microscope
Field emission gun transmission electron microscope
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Transmission Electron Microscope
Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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Veeco Explorer
Atomic force microscopy with both non-contact and pulsed force imaging modes.
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VG ESCALAB Mk I
X-Ray Photoelectron Spectroscopy (XPS). Used in the element identification of samples and can also provide information about an element's chemical environment.
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X-ray Diffractometer
Bench-top X-ray diffractometer.
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X-ray Fluorescence Analyzer
The XRF instrument is able to measure elements.
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X-ray Photoelectron Spectrometer
Fully integrated, monochromated X-ray Photoelectron Spectrometer (XPS) system.
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Last Updated: 18th June, 2024
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