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CUSTODIAN | Keith Yendall |
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ADDITIONAL CONTACT | Stuart Robertson |
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SITE | West Park |
LMCC is located within the Materials Department of Loughborough University. The purpose of the centre is to provide a high quality materials characterisation facility to support research within Loughborough University, the wider academic community and for industrial clients.
It has a wide range of analytical techniques, some of which have capabilities unique within the UK. The main areas of expertise are Electron and Optical Microscopy, Surface Analysis, X-Ray Diffraction and Thermal Analysis. The facilities are supported by a team of specialists who enable researchers to gain the maximum benefits from the instrumentation.
The LMCC not only makes use of sophisticated analytical techniques but continues to develop new methods and capabilities. It has worked with leading instrument manufacturers to help them improve their products and shift the boundaries in materials analysis.
Benchtop Scanning Electron Microscope
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Bench-top particle size distribution analyzer.
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Contact angle measurement equipment for wettability and surface free energy estimations of solid surfaces and surface tension of liquids.
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Horizontally operating quencing and deformation dilatometer.
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The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
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Bench-top turbomolecular-pumped coating system.
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Automatic micro/macro hardness tester/mapper with extended load range for Vickers and Knoop
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PFIB UXe DualBeam Microscope for Materials Science.
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Bench-top ozone cleaning system used as a pre-electron microscope preparation technique
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Advanced inverted metallurgy microscope utilising multiple imaging techniques including computerised XYZ stage control with multi feature software suite for in situ imaging and post process imaging.
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Computer controlled ion milling system.
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Used in elemental composition and depth profiling of samples with the combination of AES analysis and inert ion bombardment. Typically used for the analysis of metals, semiconductors, glasses and ceramics.
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The FE-SEM allows for high magnification and resolution imaging.
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Analytical Field Emission Scanning Electron Microscope (FE-SEM).
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High power transmitted/reflected light trinocular inspection microscope, used as a research tool for materials analysis.
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High power transmitted light microscope, used as a research tool for materials analysis.
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Bench-top particle size analyser.
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Laser ionization mass analyzer (LIMA) or Laser Microprobe Mass Spectrometry (LMMS/LAMMS), for qualitative elemental and molecular fragment analysis.
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High power optical trinocular stereo zoom microscope, used as a research tool for materials analysis.
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Bench-top plasma cleaning system.
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Bench-top sputter coating system. With Au/Pd disc target
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High resolution field emission gun scanning electron microscope (FEGSEM)
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Combined Thermogravimetric Analyser & Differential Scanning Calorimeter
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High-performance modular ThermoMechanical Analyzer
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Bench-top FT-IR spectrometer
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Modulated TMA.
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Bench-top TGA.
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Simultaneous Thermal Analysis (STA).
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The TEM uses thin samples to examine internal microstructure at a resolution down to the sub-nanometre level. A combination of imaging, electron diffraction and EDX analysis allows detailed characterisation to be carried out.
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Field emission gun transmission electron microscope
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Field emission gun transmission electron microscope (FEG-TEM) / Scanning transmission electron microscope (STEM) with chemical analysis system.
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Atomic force microscopy with both non-contact and pulsed force imaging modes.
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X-Ray Photoelectron Spectroscopy (XPS). Used in the element identification of samples and can also provide information about an element's chemical environment.
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Bench-top X-ray diffractometer.
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The XRF instrument is able to measure elements.
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Fully integrated, monochromated X-ray Photoelectron Spectrometer (XPS) system.
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Item ID #
.Last Updated: 18th June, 2024
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